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X-Ray Absorption Spectroscopy of Semiconductors [electronic resource] / edited by Claudia S. Schnohr, Mark C. Ridgway.

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dc.contributor.author Schnohr, Claudia S. editor.
dc.contributor.author Ridgway, Mark C. editor.
dc.contributor.author SpringerLink (Online service)
dc.date.accessioned 2017-12-02T15:45:33Z
dc.date.available 2017-12-02T15:45:33Z
dc.date.created 2015.
dc.date.issued 2015
dc.identifier.isbn 9783662443620
dc.identifier.uri http://dspace.conacyt.gov.py/xmlui/handle/123456789/23043
dc.description XVI, 361 p. 185 illus., 86 illus. in color.
dc.description.abstract X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
dc.description.tableofcontents Introduction to XAS -- Crystalline Semiconductors -- Disordered Semiconductors.- Nanostructures -- Magnetic Semiconductors.
dc.language eng
dc.publisher Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
dc.relation.ispartofseries Springer eBooks
dc.relation.ispartofseries Springer Series in Optical Sciences, 0342-4111 ; 190
dc.relation.ispartofseries Springer Series in Optical Sciences, 0342-4111 ; 190
dc.relation.uri http://cicco.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-662-44362-0
dc.subject Physics.
dc.subject Optics.
dc.subject Electrodynamics.
dc.subject Semiconductors.
dc.subject Spectroscopy.
dc.subject Microscopy.
dc.subject Optical materials.
dc.subject Electronic materials.
dc.subject Materials science.
dc.subject Physics.
dc.subject Semiconductors.
dc.subject Optical and Electronic Materials.
dc.subject Spectroscopy and Microscopy.
dc.subject Characterization and Evaluation of Materials.
dc.subject Applied and Technical Physics.
dc.subject Optics and Electrodynamics.
dc.subject.ddc 537.622 23
dc.subject.lcc QC610.9-611.8
dc.subject.other Physics and Astronomy (Springer-11651)
dc.title X-Ray Absorption Spectroscopy of Semiconductors [electronic resource] / edited by Claudia S. Schnohr, Mark C. Ridgway.
dc.type text
dc.identifier.doi 10.1007/978-3-662-44362-0
dc.identifier.bib 978-3-662-44362-0
dc.format.rdamedia computer
dc.format.rdacarrier online resource
dc.format.rda text file PDF


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